The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
May. 08, 2023
Analog Devices International Unlimited Company, Limerick, IE;
Jonathan Ephraim David Hurwitz, Edinburgh, GB;
Jose Bernardo Din, Biclatan, PH;
Albert Movilla Lastimada, Imus, PH;
Analog Devices International Unlimited Company, Limerick, IE;
Abstract
The present disclosure relates to a physical unclonable function, PUF, apparatus. In one example, the PUF apparatus includes a PUF source, for outputting a first signal and a second signal, where a difference between the signals is indicative of a random manufacturing difference between components in the PUF source, and an analog to digital converter, ADC, for coupling to the PUF source. In this example, the PUF apparatus is configured to operate in a plurality of different modes comprising at least a PUF coarse-measurement mode and a PUF fine-measurement mode. When operating in the PUF coarse-measurement mode and when operating in the PUF fine-measurement mode, the PUF apparatus is configured to use the ADC to generate a digital measurement that is a measure of the difference between the first signal and the second signal and generate a PUF value using the digital measurement. However, when the PUF apparatus is operating in the PUF fine-measurement mode, the digital measurement has a greater resolution than when operating in the PUF coarse-measurement mode.