The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Dec. 31, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jinmo Kang, Suwon-si, KR;

Sungoh Kim, Suwon-si, KR;

Jihyun Kim, Suwon-si, KR;

Hyungsok Yeo, Suwon-si, KR;

Donghyun Yeom, Suwon-si, KR;

Gunhee Lee, Suwon-si, KR;

Sanghun Lee, Suwon-si, KR;

Bokun Choi, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01); G06T 7/73 (2017.01); H04N 23/71 (2023.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01); G06F 3/015 (2013.01); G06T 7/74 (2017.01); H04N 23/71 (2023.01); G06T 2207/30201 (2013.01);
Abstract

An electronic device includes a sensor and a processor. The processor identifies whether a characteristic value measured from the sensor while acquiring a first image including a user's eye satisfies a designated condition. When the characteristic value satisfies the designated condition, the processor identifies a pupil position in the first image using a first scheme of extracting a feature point, based on matching with a designated pattern, acquires a second image including the user's eye, and identifies an amount of change in the second image with reference to the first image. When the amount of change in the second image is greater than or equal to a designated level, the processor calculates accuracy of the first scheme, and according to the calculated accuracy, identifies a pupil position in the second image using the first scheme, or a second scheme of extracting a feature point based on a trained network.


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