The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jan. 16, 2025
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tomoyo Miyakai, Tokyo, JP;

Kosuke Tanaka, Chiba, JP;

Ryunosuke Kawahara, Ibaraki, JP;

Akeshi Asaka, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/20 (2006.01); C08F 14/26 (2006.01);
U.S. Cl.
CPC ...
G03G 15/2057 (2013.01); C08F 14/26 (2013.01); G03G 15/2064 (2013.01);
Abstract

An electrophotographic member comprising a base layer, an elastic layer on an outer peripheral surface of the base layer, and a surface layer on an outer peripheral surface of the elastic layer, wherein the surface layer comprises a tetrafluoroethylene-perfluoroalkyl vinyl ether copolymer, a plurality of crystals of the tetrafluoroethylene-perfluoroalkyl vinyl ether copolymer having different circle-equivalent diameters is exposed on an outer surface of the surface layer, at least a part of an outer surface of the electrophotographic member is composed of a surface of the crystals and is roughened by the crystals, when an arithmetic-mean height Sa of each observation region in a specific region of the outer surface is determined, the electrophotographic member satisfies a specific relationship in a frequency distribution of the observation regions in which the arithmetic-mean height Sa is taken as a class and a class width is 0.05 μm.


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