The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jan. 07, 2022
Applicant:

Viken Detection Corporation, Burlington, MA (US);

Inventor:

Peter J. Rothschild, Newton, MA (US);

Assignee:

VIKEN DETECTION CORPORATION, Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/222 (2024.01);
U.S. Cl.
CPC ...
G01V 5/222 (2024.01);
Abstract

An x-ray inspection system includes a vehicle, a mobile conveyance, and first and second x-ray scanning modules. The first module is transportable directly or indirectly, via a transport of the vehicle, to an inspection site, and it can irradiate a near side of an object to be inspected at the site with a first x-ray scanning beam. The second scanning module is transportable to the inspection site via a combination of the mobile conveyance and the vehicle, and the second module is movable and positioned at the inspection site, via the mobile conveyance, to irradiate a far side of the object with a second x-ray scanning beam. The vehicle and the mobile conveyance are configured to be mechanically coupled together during the transport and to be mechanically decoupled from each other at the inspection site. The system enables dual-sided x-ray backscatter inspection using a mobile platform.


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