The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Aug. 18, 2023
Applicant:

Target Systemelektronik Gmbh & Co. KG, Wuppertal, DE;

Inventors:

Juergen Stein, Wuppertal, DE;

Guntram Pausch, Dresden, DE;

Assignee:

Rapiscan Holdings, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 3/06 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
G01T 3/06 (2013.01); G01T 1/2018 (2013.01);
Abstract

An apparatus to detect neutrons and gamma rays is provided. The apparatus has at least one scintillator material and at least one neutron-gamma converter in gamma communication with the scintillator material. The neutron-gamma converter is adapted to emit gamma radiation upon capturing neutrons. The apparatus further has an analyzer. The neutron-gamma converter has at least one isotope having a daughter nucleus having a level scheme having at least one long-lived excited state, where the long-lived excited state has a lifetime between 1 nanosecond and 500 nanoseconds, and is at least sometimes involved in de-excitation cascades following neutron captures. The analyzer finds and analyzes delayed detections comprising prompt components and delayed components in the recorded signal in order to quantify event parameters and to compute a measure for a thermal neutron flux the apparatus is exposed to using the event parameters.


Find Patent Forward Citations

Loading…