The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

May. 03, 2024
Applicants:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

The General Hospital Corporation, Boston, MA (US);

Inventors:

Kawin Setsompop, Stanford, CA (US);

Adam Bruce Kerr, Menlo Park, CA (US);

Xiaozhi Cao, Menlo Park, CA (US);

Jason Stockmann, Cambridge, MA (US);

Congyu Liao, Union City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/3875 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3875 (2013.01);
Abstract

A method for magnetic resonance imaging includes performing a pre-scan using a spin-echo diffusion acquisition with a one-time MRI pulse sequence to measure phase differences between diffusion and non-diffusion acquisitions, which correspond to an estimation of eddy-current-induced phase in a diffusion-prepared sequence; and performing a scan using arbitrary waveform shim currents applied to a shim array during the acquisition, wherein the shim currents are determined from the measured phase differences from the pre-scan to create opposite phase maps to compensate eddy-current or system-imperfection-induced phase differences; wherein the scan and pre-scan are performed using an MRI apparatus with a channel integrated receiver and the shim array.


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