The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jan. 26, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Julius Seeger, Munich, DE;

Jakob Hammer, Munich, DE;

Thorsten Lueck, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2893 (2013.01); G08B 21/182 (2013.01);
Abstract

A measurement system includes a test instrument, a monitoring circuit, a dispatching circuit, and an electronic device. The test instrument includes a testing circuit configured to conduct measurements on a measurement signal received from a device under test and/or to generate a test signal for the device under test. The monitoring circuit is configured to monitor a status of the at least one test instrument, wherein the status is associated with a measurement being performed on the device under test. The monitoring circuit is configured to generate an alert signal if a status change of the at least one test instrument requiring an external action is detected. The dispatching circuit is configured to transmit the alert signal to the electronic device. The electronic device can be established separately from the test instrument. Further, a test instrument is described.


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