The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Mar. 09, 2021
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
An analysis device according to the present invention comprises: at least one inspection device that inspects a specimen; and at least one specimen production device that produces a specimen. The analysis device is provided with a data processing unit that processes data. The inspection device and the specimen production device are each provided with a communication unit for communicating with each other. The specimen production device is provided with a control unit that controls the specimen production device and a production unit that produces a specimen. The inspection device is provided with a control unit that controls the inspection device and an inspection unit that inspects a specimen. The data processing unit calculates a value [number of specimens A] representing the number of specimens which have not been delivered to the inspection device and a value [number of specimens B] representing the sum of the number of specimens for which inspection can be additionally started in the inspection device and the number of specimens which are being inspected and the inspection of which will be completed in a prescribed time. The control unit of the specimen production device prohibits production of a new specimen in the specimen production device when the [number of specimens A] and the [number of specimens B] satisfy a first relationship.