The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Dec. 27, 2023
Applicant:

Purdue Research Foundation, West Lafayette, IN (US);

Inventors:

Muhammad A. Alam, West Lafayette, IN (US);

Ajanta Saha, West Lafayette, IN (US);

Assignee:

Purdue Research Foundation, West Lafayette, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01N 27/333 (2006.01);
U.S. Cl.
CPC ...
G01N 27/4163 (2013.01); G01N 27/333 (2013.01); G01N 27/4165 (2013.01);
Abstract

A method of temperature self-calibrating ion-selective electrodes (ISEs) is disclosed which includes calibrating at least two ISEs against a reference electrode (RE) in a calibration solution with a predetermined concentration as the temperature of the calibration solution varies according to a known schedule, wherein the calibration of the at least two ISEs includes determining calibration parameters of each of the at least two ISEs with respect to the RE, placing the at least two calibrated ISEs and the RE into a field solution for determining one or more field parameters of the field solution, measuring voltage across a first of the at least two calibrated ISEs and the RE (V), measuring voltage across a second of the at least two calibrated ISEs and the RE (V), determining V−V, and determining the one or more field parameters.


Find Patent Forward Citations

Alam, Muhammad. (2026). System and method for self-calibrating of ion selective electrodes based on differential voltage measurement (U.S. Patent No. 12656306). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12656306

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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