The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Aug. 31, 2023
Applicant:
Lumafield, Inc., Cambridge, MA (US);
Inventors:
Adam P. Damiano, Somerville, MA (US);
Kevin David Cedrone, Boxborough, MA (US);
Assignee:
Lumafield, Inc., Cambridge, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G06T 12/10 (2026.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 12/10 (2026.01); G01N 2223/1016 (2013.01); G01N 2223/303 (2013.01); G01N 2223/306 (2013.01); G01N 2223/323 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01); G01N 2223/423 (2013.01);
Abstract
Systems, methods, apparatuses, and computer program products for nonintrusive scanning of objects using x-ray electromagnetic radiation. One method may include adjusting, by a computed tomography scanning device, at least one operation parameter including a grey value threshold based upon a material composition of a scan target; and collecting, by the computed tomography scanning device, at least one x-ray frame of the scan target based upon the at least one adjusted operation parameter.