The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Oct. 17, 2022
Viasat, Inc., Carlsbad, CA (US);
Matthew Cover, Chandler, AZ (US);
Justin M. Hallas, San Marcos, CA (US);
VIASAT, INC., Carlsbad, CA (US);
Abstract
Systems and methods are described herein for waveguide defect detection. In some examples, a statistical value of pixels of a number of image locations in one or more images of the waveguide can be computed. An extremity matrix can be generated based on an anomaly detector model and statistical pixel data that includes statistical values computed for respective image locations in the one or more images of the waveguide. A decision can be made to determine whether the waveguide is a conforming or a non-conforming waveguide based on the extremity matrix and a set of thresholds. In some examples, the statistical value is a mean intensity value or an average intensity value.