The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jun. 27, 2022
Hitachi, Ltd., Tokyo, JP;
Tomonari Misawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Particle size measurement and material discrimination can be performed simultaneously with a less expensive configuration. A particle measuring apparatus includes: a first light source and a second light source that irradiate a sample containing particles of a predetermined material with parallel light; an imaging unit that captures a scattered light image of the particles by the parallel light emitted from the first light source, and a shadow image of the particles by the parallel light emitted from the second light source; and an image processing unit that performs material discrimination of the particles based on correspondence between scattered light intensity of the particles specified based on the scattered light image and a shadow size of the particles specified based on the shadow image, and a theoretical correlation curve showing a theoretical value of the correspondence of the particles, and calculates a particle size of the particles.