The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Oct. 25, 2023
Applicant:
Kohta Aoyagi, Kanagawa, JP;
Inventor:
Kohta Aoyagi, Kanagawa, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B41F 33/00 (2006.01);
U.S. Cl.
CPC ...
B41F 33/0036 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/30144 (2013.01);
Abstract
An image inspection apparatus includes processing circuitry. The processing circuitry sets abnormality detection conditions excluding specific conditions specified from at least one of input image information related to input image data and print medium information related to a print medium. The processing circuitry acquires an image formed on the print medium based on the input image data. The processing circuitry detects whether an abnormality satisfying the abnormality detection conditions excluding the specific conditions has occurred in the acquired image.