The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Mar. 22, 2022
Applicant:

Roche Diagnostics International Ag, Rotkreuz, CH;

Inventors:

Peter Hess, Aristau, CH;

Samuel Albin, Siat, CH;

Placi Wenzin, Walenstadt, CH;

Fabian Caduff, Chur, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 45/76 (2006.01); B01L 9/00 (2006.01); B29L 31/00 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
B29C 45/7686 (2013.01); B01L 9/543 (2013.01); B01L 9/56 (2019.08); G01B 11/2433 (2013.01); B01L 2200/143 (2013.01); B29C 2945/76103 (2013.01); B29C 2945/76421 (2013.01); B29C 2945/76464 (2013.01); B29L 2031/753 (2013.01);
Abstract

A method and apparatus for inspecting pipette tips for defects. A holding device picks up multiple pipette tips from a first carrier. A first image acquisition device, with its optical axis aligned with the longitudinal axes of the tips, captures first image data of the pipette tip outlet openings. A second image acquisition device, with its optical axis transverse to the longitudinal axes, simultaneously captures second image data of the side surfaces of the multiple tips. A data processing system determines if the image data is within predefined limits. Pipette tips with data outside the limits are discarded, while tips with data within the limits are dispensed into a second carrier. The pipette tips may be rotated about their longitudinal axes during the acquisition of the second image data to check for concentricity.


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