The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Nov. 10, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yoshifumi Oka, Yokohama, JP;

Hirofumi Kawai, Kawasaki, JP;

Kenichi Shimoyama, Ota, JP;

Seiji Tokura, Kawasaki, JP;

Akihito Ogawa, Fujisawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 13/08 (2006.01); B25J 9/16 (2006.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
B25J 9/1687 (2013.01); B25J 13/08 (2013.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01);
Abstract

According to one embodiment, a picking system includes a picking robot and a control device. The picking robot transfers an object from a first space to a second space by using a robot hand. The control device controls the picking robot. When a first measurement result related to a shape of the object in the first space when viewed along a first direction is acquired, the control device performs a first calculation of calculating a position candidate for placing the object in the second space based on the first measurement result. When a second measurement result related to a shape of the object when viewed along a second direction is acquired, the control device performs a second calculation of calculating a position of the robot hand when placing the object in the second space based on the second measurement result and the position candidate.


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