The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Sep. 06, 2024
Eosdx Inc., Menlo Park, CA (US);
Alexander P. Lazarev, Lake Forest, CA (US);
Pavel Lazarev, Box Elder, SD (US);
EosDx Inc., Menlo Park, CA (US);
Abstract
The present disclosure provides systems and methods for determining one or more diagnostic indicators using X-ray diffraction (XRD). In some embodiments, the techniques described herein relate to a system including: a fixture configured to position a region of skin of a patient within a measurement region; an X-ray source coupled to the fixture and configured to emit an X-ray beam that overlaps with the measurement region; an X-ray receiver coupled to the fixture, the X-ray receiver including a coordinate-sensitive digital detector of X-rays; and one or more processors coupled to the X-ray receiver. The one or more processors can be configured to collect XRD data from the X-ray receiver, to process the XRD data, and to determine a diagnostic indicator for assessment of a physiological or pathological condition based on the processed XRD data.