The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Oct. 19, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Xiaohui Zhan, Vernon Hills, IL (US);
Ilmar Hein, Vernon Hills, IL (US);
Ruoqiao Zhang, Vernon Hills, IL (US);
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A photon-counting imaging system is provided. The system includes a photon-counting detector and processing circuitry. The detector acquires, from an imaging object, projection data for a plurality of projection views. The detector has a plurality of detector pixels that are arranged in both a channel direction and a segment direction on a surface of the detector. The processing circuitry obtains the projection data acquired by the detector. The projection data includes first and second projection data. The processing circuitry processes, with a first energy bin setting, the first projection data, the first energy bin setting having m energy bins, and processes, with a second energy bin setting, the second projection data, the second energy bin setting having n energy bins, where n>m. The processing circuitry generates, based on the processed first projection data and the processed second projection data, a material decomposition image of the imaging object.