The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Jan. 11, 2022
Tsinghua University, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Li Zhang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Qingping Huang, Beijing, CN;
Jinning Liang, Beijing, CN;
Mingzhi Hong, Beijing, CN;
Yi Cheng, Beijing, CN;
Minghua Qiu, Beijing, CN;
Yao Zhang, Beijing, CN;
Jianxue Yang, Beijing, CN;
Lei Zheng, Beijing, CN;
Tsinghua University, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
A radiographic inspection device and a method of inspecting an object are provided. The radiographic inspection device includes: a support frame, where an inspection space applicable to inspect an object is formed within the support frame, and the inspection space has an entrance and an exit which are connecting to an outside; a transfer channel applicable to carry the object to move through the inspection space; a first shielding curtain and a second shielding curtain respectively mounted at the entrance and the exit; and a driving mechanism mounted on the support frame and configured to drive at least one of the first shielding curtain and the second shielding curtain to move, in response to the object getting close to or moving away from at least one of the entrance and the exit, so as to open or close the at least one of the entrance or the exit.