The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Jun. 22, 2022
Applicant:
Sharp Kabushiki Kaisha, Sakai City, JP;
Inventors:
Hsin-Hsi Tsai, Taipei, TW;
Heng-Li Chin, Taipei, TW;
Mei-Ju Shih, Taipei, TW;
Yung-Lan Tseng, Taipei, TW;
Ming-Hung Tao, Taipei, TW;
Assignee:
SHARP KABUSHIKI KAISHA, Sakai City, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04W 72/044 (2023.01); H04W 76/15 (2018.01); H04W 76/27 (2018.01); H04W 74/0833 (2024.01); H04W 74/0836 (2024.01); H04W 74/0838 (2024.01);
U.S. Cl.
CPC ...
H04L 5/0098 (2013.01); H04W 72/0473 (2013.01); H04W 76/15 (2018.02); H04W 76/27 (2018.02); H04W 74/0833 (2013.01); H04W 74/0836 (2024.01); H04W 74/0838 (2024.01);
Abstract
A method for a UE for performing SDT is provided. The method includes receiving, from a BS, system information that includes a SIB1; determining whether to initiate an SDT procedure based on one or more conditions, the one or more conditions including the SIB1 including an SDT configuration; and initiating the SDT procedure in a case that the one or more conditions are fulfilled. A UE using the method is also provided.