The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Apr. 05, 2023
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Hwi-Gang Kim, Daejeon, KR;

Sangbeom Lee, Daejeon, KR;

Kyu Hyung Kim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01); G06V 10/74 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/246 (2017.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01); G06V 10/761 (2022.01); G06V 10/764 (2022.01); G06T 2207/20044 (2013.01);
Abstract

The present disclosure relates to a method and apparatus for classifying and evaluating a motion based on a motion feature. The method of classifying and evaluating a motion based on a motion feature includes obtaining video data by capturing a first motion, obtaining information on locations of joints of the first motion based on the video data, generating motion feature data of the first motion based on the information on the locations of the joints, and selecting a model motion most similar to the first motion, among a plurality of model motions, based on the motion feature data of the first motion and motion feature data of the plurality of model motions.


Find Patent Forward Citations

Kim, Hwi-Gang. (2026). Method and apparatus for classifying and evaluating motion based on motion feature (U.S. Patent No. 12651352). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12651352

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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