The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Mar. 04, 2024
Applicant:

Tomocube, Inc., Daejeon, KR;

Inventors:

Jaephil Do, Daejeon, KR;

Sumin Lee, Daejeon, KR;

Hye-Jin Kim, Daejeon, KR;

Assignee:

Tomocube, Inc., Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/64 (2006.01); G06T 15/00 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G01N 21/6428 (2013.01); G06T 15/00 (2013.01); G01N 2021/6439 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/30024 (2013.01); G06T 2210/41 (2013.01);
Abstract

Disclosed are a method and apparatus for detectingusing the measurement of a 3-D quantitative phase image. The method of detectingmay include generating a three-dimensional (3-D) quantitative phase image of a sample by characterizing the sample by making quantitative a phase shift derived from light that passes through the sample, and determining whether the sample has been infected withby analyzing behavioral characteristics of the generated 3-D quantitative phase image.


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