The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Jul. 31, 2024
Sap SE, Walldorf, DE;
Xinyan Chen, Singapore, SG;
Yinan He, Singapore, SG;
Junxiang Jia, Singapore, SG;
Anantharaman Ravi, Sinapore, SG;
SAP SE, Walldorf, DE;
Abstract
Systems and methods described herein relate to semantic feature extraction for auto-labeling of defects. An image is processed to obtain structured text data describing a target defect of an item appearing in the image. The structured text data is processed to convert the structured text data into a target embedding associated with the target defect. The target embedding is automatically compared with a plurality of reference embeddings to obtain a comparison result. The plurality of reference embeddings is stored in a reference data structure that associates each reference embedding with a respective defect label. Based on the comparison result, the reference data structure is updated and assignment of a target defect label to the image is initiated. Such operations may be performed for each of a plurality of images in an unlabeled dataset.