The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Dec. 26, 2023
Applicant:

Deepvisions Co.,ltd., Seoul, KR;

Inventors:

Bong Su Kang, Seoul, KR;

Jun Sang Cho, Seoul, KR;

Won Hee Jo, Seoul, KR;

Nalinh Thoummala, Seoul, KR;

Sung Jae Lee, Seoul, KR;

Hong Kyu Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30232 (2013.01);
Abstract

A fine dust measurement system includes a video photographing device that photographs a target place, generates a converted image or converted data by converting all or a portion of the photographed image and transmits the converted image or converted data, and a fine dust measurement that receives the converted image or converted data from the video photographing device, and trains a deep learning model to output a fine dust concentration of the target place by inputting the received converted image or converted data into the deep learning model.


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