The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Jun. 24, 2021
International Business Machines Corporation, Armonk, NY (US);
Jing James Xu, Xi′an, CN;
Xue Ying Zhang, Xi′an, CN;
Jing Xu, Xi′an, CN;
Si Er Han, Xi′an, CN;
Dong Hai Yu, Xi′an, CN;
Xiao Ming MA, Xi′an, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method, system and computer program product for detecting feature traits from an imbalanced dataset. A first regression model is built based on a simulated dataset to compute contribution scores for the features to make a target a positive case. A variance in the features' original values for each feature of the first set of features (those features with contribution scores for positive cases that exceed a threshold value) between the positive and negative cases is determined. A second regression model is built to calculate a predictor importance value for a second set of features (features from the first set of features with a variance in their original values for both positive and negative cases that exceeds a threshold value). Feature traits are then extracted from a group of clustered positive cases with features of the second set of features containing a predictor importance value exceeding a threshold value.