The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Sep. 02, 2021
Applicants:

Nec Laboratories America, Inc., Princeton, NJ (US);

Nec Corporation, Tokyo, JP;

Inventors:

Luan Tang, Pennington, NJ (US);

Wei Cheng, Princeton Junction, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Yuji Kobayashi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/088 (2023.01); G06N 3/044 (2023.01); G06N 3/045 (2023.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06N 3/044 (2023.01); G06N 3/045 (2023.01);
Abstract

Methods and systems for training and deploying a neural network mode include training a modular encoder model using training data collected from heterogeneous system types. The modular encoder model includes layers of neural network blocks and a selectively enabled connections between neural network blocks of adjacent layers. Each neural network block includes neural network layers. The modular encoder model is deployed to a system corresponding to one of the heterogeneous system types.


Find Patent Forward Citations

Tang, Luan. (2026). Anomaly detection in cyber-physical systems (U.S. Patent No. 12651170). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12651170

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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