The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Apr. 25, 2023
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Rong Yu, Beijing, CN;

Wenfeng Yang, Beijing, CN;

Haozhi Sha, Beijing, CN;

Jizhe Cui, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/15 (2006.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
G06F 17/15 (2013.01); H01J 37/222 (2013.01); H01J 2237/223 (2013.01); H01J 2237/2802 (2013.01);
Abstract

The present disclosure discloses a method, which includes: obtaining, by controlling to move an electron beam to scan a sample, a diffraction intensity of the sample at each scanning position; initializing a sample transmission function and an electron beam function, establishing, based on the diffraction intensity, the sample transmission function, and the electron beam function, a forward propagation model containing to-be-optimized parameters, and calculating a value of a loss function; solving a derivative of the loss function with respect to the to-be-optimized parameters, to obtain gradients of the to-be-optimized parameters in the sample transmission function and the electron beam function, optimizing the to-be-optimized parameters based on the gradients, and updating the value of the loss function; and repeating an iteration process until an iteration termination condition is satisfied, and outputting an optimized sample transmission function and an optimized electron beam function.


Find Patent Forward Citations

Yu, Rong. (2026). Method and apparatus for reconstructing atomic spatial distribution and electron beam function (U.S. Patent No. 12651036). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12651036

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