The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Nov. 05, 2024
Thomson Reuters Enterprise Centre Gmbh, Zug, CH;
Sina Gholamian, Toronto, CA;
Stavroula Skylaki, Zug, CH;
Varun Chandra, Hamilton, CA;
Emre Caglar, Burlington, CA;
Eduardo Vitor, Campinas, BR;
Steven Rogers, Plano, TX (US);
Anne Woelke, Dallas, TX (US);
Jacqueline Nicole Martinez, London, GB;
Gianfranco Romani, Schlieren, CH;
Elizabeth E. Connell, Rochester, NY (US);
Fernando Tochini Aliaga, Celina, TX (US);
Abstract
This disclosure provides systems, methods, and devices for automatic product classification using deep learning and generative artificial intelligence (AI) models for a harmonized system (HS) product classification. A method includes generating embeddings based on an input dataset. The method includes applying a deep learning model to the embeddings to produce a prediction set including classifications corresponding to the embeddings. The method includes converting the classifications to a first set of similarity metrics. The method includes determining a second set of similarity metrics based on the embeddings using a semantic similarity model. The method includes generating a third set of similarity metrics based on an output of the semantic similarity model. The method includes outputting a ranked set of predictions corresponding to the input dataset based on the first set of similarity metrics, the second set of similarity metrics, and the third set of similarity metrics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile