The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Aug. 05, 2024
Bank of America Corporation, Charlotte, NC (US);
Maharaj Mukherjee, Poughkeepsie, NY (US);
Carl Benda, Charlotte, NC (US);
Colin Murphy, Charlotte, NC (US);
Viraj Shah, Maharashtra, IN;
Rahul Uniyal, Uttarakhand, IN;
Aditya Krishnanand Chaubey, Maharashtra, IN;
Vijay Yarabolu, Hyderabad, IN;
Duy Minh Pham, Charlotte, NC (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Hierarchical modelling and advanced feature engineering discover abnormalities in time series data with irregular trends. Data is collected in real time to ensure temporal integrity in the invention. Extraction filters and isolates useful data. Data cleansing removes noise and extraneous data after preliminary analysis identifies patterns and abnormalities. Feature engineering organizes cleansed data for machine learning algorithms. Primary storage stores this data for fast retrieval and extensive trend analysis. Holidays and weekends provide unique patterns in trend analysis. These trends are used to cluster data and create hierarchical predictive models, starting with a first-order model for general trends and increasing in order to refine residuals. Serializing these models improves storage and retrieval. Trend clusters are created from new data points, and algorithms detect pattern deviations. Statistical tests and machine learning classifiers identify anomalies and create alerts and remedial measures. The system monitors and analyzes incoming data to detect anomalies.