The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Feb. 06, 2024
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Hendrik Bartko, Unterhaching, DE;

Rafid Ahmed, Munich, DE;

Reiner Goetz, Oberhausen, DE;

Georg Schwarz, Gröbenzell, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/273 (2006.01); G01R 31/28 (2006.01); G06F 11/277 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G01R 31/2846 (2013.01); G06F 11/277 (2013.01);
Abstract

The present invention relates to a method and an apparatus for detecting anomalies in an operation behavior of a device under test (DUT), in particular during electromagnetic susceptibility (EMS) measurements. The apparatus comprises a monitoring unit adapted to generate a first set of observation data of the operation behavior of a DUT while the DUT is not subjected to disturbances and adapted to generate a second set of observation data of the operation behavior of a DUT while the DUT is subjected to disturbances and comprising an AI module trained with the first set of observation data generated by the monitoring unit and adapted to process the second set of observation data to detect anomalies in the operation behavior of the DUT while being subjected to the disturbances and comprising a reporting unit adapted to reporting anomalies in the operation behavior of the DUT detected by the trained AI module.


Find Patent Forward Citations

Bartko, Hendrik. (2026). Detection of anomalies in behavior of a device under test subjected to disturbances using ai algorithm trained on observations from when the dut is not subjected to disturbances (U.S. Patent No. 12650910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12650910

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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