The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Jun. 29, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Gautam Salil Nandi, Bangalore, IN;

Rajavelu Thinakaran, Bangalore, IN;

Hariharan Srinivasan, Chennai, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 19/18 (2006.01); G01R 35/00 (2006.01); H03F 3/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 19/18 (2013.01); G01R 35/005 (2013.01); H03F 3/04 (2013.01);
Abstract

In some examples, a method of performing measurement of a device under test (DUT) coupled to a connector includes determining a first voltage signal representative of a current of the DUT, the current flowing through the connector. The method also includes determining a second voltage signal representative of a voltage of the DUT, as provided at the connector. The method also includes determining a calibration current according to the first voltage signal. The method also includes modifying measurement of the DUT according to the calibration current.


Find Patent Forward Citations

Nandi, Gautam. (2026). Calibration for routing resistance induced error (U.S. Patent No. 12650460). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12650460

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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