The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Dec. 06, 2023
Microtest S.p.a., Vicopisano, IT;
Giuseppe Amelio, San Pietro, IT;
MICROTEST S.P.A., Vicopisano, IT;
Abstract
Probe head for wafer-level burn-in test, comprising: a first and a second alignment plates arranged parallel to each other and provided with a plurality of passage holes; at least one spacing element interposed between the first and the second alignment plates and designated for keeping them in a prefixed spaced apart relationship; a plurality of probes housed between the passage holes of the alignment plates; said probes comprising a stem, an input contact and an output contact at the opposite ends of said stem, wherein the input contact passes through the second alignment plate to electrically connect to a corresponding testing channel of a probe card and the output contact comes out of the first alignment plate and is designed to contact a termination of a wafer to be tested; said output contact being retractable into the stem in opposition to a counteracting elastic element.