The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2026
Filed:
Sep. 26, 2022
Applicant:
Schaeffler Technologies Ag & Co. KG, Herzogenaurach, DE;
Inventor:
Tuo Luo, Copley, OH (US);
Assignee:
Schaeffler Technologies AG & Co. KG, Herzogenaurach, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/60 (2006.01); G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
G01N 3/60 (2013.01); G01N 3/32 (2013.01); G01N 2203/0064 (2013.01); G01N 2203/0066 (2013.01); G01N 2203/0073 (2013.01); G01N 2203/0224 (2013.01);
Abstract
A method of testing a test specimen assembly is disclosed herein. The method can include providing the test specimen assembly which includes a control element and a test element, which are formed from different materials.
Luo, Tuo. (2026). Test assembly and method of testing an assembly for thermal fatigue (U.S. Patent No. 12650369). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12650369
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile