The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Aug. 24, 2021
Applicant:

Swiss Krono Tec Ag, Lucerne, CH;

Inventors:

Sebastian Dicke, Bantikow, DE;

Sabrina Pfeiffer, Kyritz, DE;

Assignee:

SWISS KRONO TEC AG, Lucerne, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); B41J 11/00 (2006.01); B41M 5/00 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/46 (2013.01); B41J 11/008 (2013.01); B41M 5/0076 (2013.01); H04N 1/00034 (2013.01); H04N 1/00063 (2013.01); H04N 1/00082 (2013.01); H04N 1/00092 (2013.01); B41J 2203/01 (2020.08);
Abstract

The disclosure relates to a method for printing a decoration to be printed onto a plurality of print surfaces by digital printing equipment. The method includes: providing a digital template and reference measurement data of a decoration to be printed, said data being hyperspectral and spatially resolved, printing the decoration to be printed onto a print surface using the digital template, measuring measured variables of the decoration printed on the print surface (), thereby obtaining print measurement data that are hyperspectral and spatially resolved, comparing the print measurement data with the reference measurement data and determining a measure of deviation of the print measurement data () from the reference measurement data, modifying the digital template if the measure of the deviation meets a predetermined criterion, and repeating the above steps.


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