The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Apr. 26, 2019
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Takaaki Kobayashi, Tokyo, JP;

Yuma Itahashi, Tokyo, JP;

Takeshi Kodaira, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 17/02 (2006.01); G01N 29/07 (2006.01);
U.S. Cl.
CPC ...
G01B 17/02 (2013.01); G01N 29/07 (2013.01); G01N 2291/02854 (2013.01);
Abstract

A monitoring device is provided that is capable of quickly and accurately detecting the occurrence of an abnormality in a pipe on the basis of the trend of the wall thickness of the pipe. The monitoring device includes a degree of damage acquisition unit configured to acquire a degree of damage to a pipe, and a determination unit configured to determine whether the degree of damage has fallen lower than a lower limit threshold value determined on the basis of a reference operating parameter related to fluid flowing through the pipe.


Find Patent Forward Citations

Kobayashi, Takaaki. (2026). Monitoring device, monitoring system, monitoring method, and program for determining degree of damage (U.S. Patent No. 12650301). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12650301

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…