The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2026

Filed:

Feb. 26, 2024
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Ibrahim Onifade, Katy, TX (US);

Shu Chen, Rochester Hills, MI (US);

Leila Ghorban Zadeh, Seattle, WA (US);

Christian Haller, Austin, TX (US);

Joon Hwang, Pflugerville, TX (US);

Mason David Gemar, Cedar Park, TX (US);

Fan Bai, Ann Arbor, MI (US);

Gui Chen, Sterling Heights, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 30/12 (2020.01); G01C 21/30 (2006.01); G01S 19/01 (2010.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
B60W 30/12 (2013.01); G01C 21/30 (2013.01); G01S 19/01 (2013.01); G06V 20/588 (2022.01);
Abstract

A method for estimating lane lines receiving, by a controller, telemetry data and map data. The method further includes matching the telemetry data with the map data to generate map-matched telemetry data and determining, using a gaussian mixture model (GMM), a first set of lane line points relating to the lane lines of the roadway within the predetermined region. Also, the method includes determining, using a lane-point detection (LPD) model, a second set of lane line points relating to the lane lanes of the roadway within the predetermined region and determining, using a lane-point clustering (LPC) model, a plurality of lane lines of the roadway based on the first set of lane line points and the second set of lane line points.


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