The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Apr. 08, 2022
Applicant:

Hitachi Power Semiconductor Device, Ltd., Ibaraki, JP;

Inventors:

Tomoyuki Miyoshi, Tokyo, JP;

Katsuaki Saito, Hitachi, JP;

Tomoyasu Furukawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 12/00 (2025.01); H10D 12/01 (2025.01); H10D 62/10 (2025.01); H10D 62/17 (2025.01); H10D 62/53 (2025.01); H10D 84/60 (2025.01); H10P 32/10 (2026.01); H02M 7/537 (2006.01); H02P 27/06 (2006.01); H03K 17/567 (2006.01);
U.S. Cl.
CPC ...
H10D 12/481 (2025.01); H10D 12/038 (2025.01); H10D 62/106 (2025.01); H10D 62/127 (2025.01); H10D 62/393 (2025.01); H10D 62/53 (2025.01); H10D 84/617 (2025.01); H10P 32/171 (2026.01); H10P 32/18 (2026.01); H02M 7/537 (2013.01); H02P 27/06 (2013.01); H03K 17/567 (2013.01);
Abstract

A semiconductor device has both low conduction loss and low switching loss, and uniformity of heat generation during operation. The semiconductor device has high and low conduction regions in one semiconductor chip, and includes: in the low conduction region, a first carrier control gate connected to a first gate electrode, and a switching gate connected to a second gate electrode controllable independently of the first gate electrode; and in the high conduction region, a second carrier control gate connected to a third gate electrode. In the semiconductor device, of the first carrier control gate and the switching gate, the first carrier control gate is placed at an end portion of the low conduction region on a boundary side with the high conduction region, and a concentration of carriers that can be accumulated at conduction time is lower in the low conduction region than in the high conduction region.


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