The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Feb. 13, 2023
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Hyung Joon Kim, McKinney, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/53 (2014.01); H04N 19/433 (2014.01);
U.S. Cl.
CPC ...
H04N 19/53 (2014.11); H04N 19/433 (2014.11);
Abstract
A method and apparatus for reduction of reference data transfer and coding efficiency improvement. The method includes performing pre-analysis on a decimated version of an image, and utilizing the predictions of the pre-analysis to transfer smaller reference area.
Quick Actions:
Kim, Hyung. (2026). Method and apparatus for reference area transfer with pre-analysis (U.S. Patent No. 12647604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12647604
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile