The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Sep. 27, 2023
T-mobile Usa, Inc., Bellevue, WA (US);
Johnson Chau, Seattle, WA (US);
Andrew Nelson, Yakima, WA (US);
Ryan Christopher Lindstrom, De Soto, KS (US);
Grant Edward Taylor, Seattle, WA (US);
T-Mobile USA, Inc., Bellevue, WA (US);
Abstract
Techniques for determining calibration data associated with a radio frequency (RF) testing environment are discussed herein. For example, an RF signal can be input to the RF enclosure and selectively applied to discrete attenuators. The attenuators can attenuate a strength of the signal and a signal strength can be measured by various user equipment (UEs) that are located within an RF enclosure. In some examples, a plurality of measured reference signal received power (RSRP) values can be determined by a plurality of UEs associated with a particular attenuation level. Different attenuation levels can be measured, and an average attenuation can be determined for attenuation steps. Measured attenuation steps can be extrapolated to other attenuation levels to expedite the calibration process. Then, a testing plan can be applied to the RF enclosure and the calibration data can be used to ensure accurate signals for testing UEs.