The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Dec. 30, 2021
Applicant:

Mitsubishi Chemical Corporation, Chiyoda-ku, JP;

Inventors:

Shunsuke Yamada, Inashiki-gun, JP;

Nobuyuki Ishiwatari, Inashiki-gun, JP;

Satoshi Akasaka, Inashiki-gun, JP;

Daigo Nagayama, Inashiki-gun, JP;

Shingo Morokuma, Inashiki-gun, JP;

Koichi Nishio, Inashiki-gun, JP;

Iwao Soga, Inashiki-gun, JP;

Hideaki Tanaka, Inashiki-gun, JP;

Takashi Kameda, Sakaide, JP;

Tooru Fuse, Sakaide, JP;

Hiromitsu Ikeda, Sakaide, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/583 (2010.01); C01B 32/21 (2017.01); H01M 4/587 (2010.01); H01M 4/62 (2006.01); H01M 10/0525 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/587 (2013.01); C01B 32/21 (2017.08); H01M 4/583 (2013.01); H01M 4/625 (2013.01); H01M 10/0525 (2013.01); C01P 2004/32 (2013.01); C01P 2006/14 (2013.01); C01P 2006/16 (2013.01); H01M 2004/021 (2013.01);
Abstract

A carbon material may include granulated particles made of a carbonaceous material and satisfying (2L), wherein X is a volume-based average particle diameter determined by laser diffraction, and Xis an equivalent circular diameter determined from a cross-sectional SEM image, which is a reflected electron image acquired at 10 kV, wherein the carbon material has an average inter-void distance Z of 30 granulated particles randomly selected from a cross-sectional SEM image of the carbon material, as Zave, and wherein the carbon material has volume-based average particle diameter X determined by laser diffraction in a Zave/X ratio of 0.060 or less.


Find Patent Forward Citations

Loading…