The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Sep. 13, 2024
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chih-Chieh Chen, Taoyuan City, TW;

Chih-Chiang Weng, Taoyuan City, TW;

Yo-Sung Lee, New Taipei City, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); B23K 10/00 (2006.01); B29D 11/00 (2006.01); G01B 5/20 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32963 (2013.01); B23K 10/003 (2013.01); B29D 11/00009 (2013.01); B29D 11/0098 (2013.01); H01J 37/3244 (2013.01); H01J 37/32449 (2013.01); H01J 37/32715 (2013.01); H01J 37/32825 (2013.01); G01B 5/20 (2013.01); G01B 11/2441 (2013.01); H01J 2237/20207 (2013.01); H01J 2237/20214 (2013.01);
Abstract

A surface processing equipment using energy beam including a multi-axis platform, a surface profile measuring device, an energy beam generator and a computing device is provided. The multi-axis platform is configured to carry a workpiece and move the workpiece to the first position or the second position. The surface profile measuring device has a working area, and the first position is located on the working area. The surface profile measuring device is configured to measure the workpiece to obtain surface profile. The energy beam generator is configured to provide an energy beam to the workpiece for processing, and the second position is located on a transmission path of the energy beam. The computing device is connected to the surface profile measuring device and the energy beam generator. The computing device adjusts the energy beam generator according to the error profile.


Find Patent Forward Citations

Loading…