The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Oct. 01, 2024
Sandisk Technologies, Inc., Milpitas, CA (US);
Mahim Gupta, San Jose, CA (US);
Jia Li, San Francisco, CA (US);
Sugandha Sharma, Pleasanton, CA (US);
Sandisk Technologies, Inc., Milpitas, CA (US);
Abstract
A sensed read threshold voltage can sometimes vary from a write threshold voltage due to one or more factors, such as data retention issues and program disturb conditions. A bit-error-rate estimation scan (BES) can be used to calibrate and optimize read thresholds in this situation. However, as more wordlines are introduced, BES may not provide suitable calibration. In such situations, the BES can be re-performed on certain pages using an additional offset.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile