The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jul. 21, 2023
Cellavision Ab, Lund, SE;
Martin Almers, Lund, SE;
Jesper Jönsson, Lund, SE;
CELLAVISION AB, Lund, SE;
Abstract
The present inventive concept relates to a microscope system and a method for processing a plurality of digital images of a sample. The method comprises: acquiring a first input set of digital images by: illuminating, by an illumination system, the sample with a first subset of a plurality of illumination patterns, and capturing a digital image of the sample for each illumination pattern of the first subset of the plurality of illumination patterns, thereby forming the first input set of digital images; inputting the first input set of digital images into a first set of machine learning models configured to output a first inference output; acquiring a second input set of digital images by: illuminating, by the illumination system, the sample with a second subset of the plurality of illumination patterns, and capturing a digital image of the sample for each illumination pattern of the second subset of the plurality of illumination patterns, thereby forming the second input set of digital images; inputting the second input set of digital images into a second set of machine learning models configured to output a second inference output, wherein the second set of machine learning models is different from the first set of machine learning models; and inputting the first inference output and the second inference output into an image processing machine learning model being trained to process the plurality of digital images of the sample using the first inference output and the second inference output.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile