The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Nov. 07, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Tomokazu Kaneko, Tokyo, JP;

Soma Shiraishi, Tokyo, JP;

Ryosuke Sakai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/776 (2022.01); G06V 10/764 (2022.01); G06V 10/77 (2022.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06V 10/776 (2022.01); G06V 10/764 (2022.01); G06V 10/7715 (2022.01); G06V 20/46 (2022.01);
Abstract

A learning device includes a learning model for a still image. The learning model includes a mask generation means configured to generate a first object mask identifying an area in which an object exists in a still image, for each individual object. A first parameter including at least one parameter used for processing of generating the first object mask is adjusted based on a first loss. The first loss indicates a difference of the first object mask with respect to a second object mask identifying an area in which an object exists in a moving image including the still image, for each individual object.


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Quick Actions:

Kaneko, Tomokazu. (2026). Learning device, parameter adjustment method and recording medium (U.S. Patent No. 12646301). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12646301

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