The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jul. 17, 2023
Nvidia Corporation, Santa Clara, CA (US);
Minwoo Park, Saratoga, CA (US);
Trung Pham, San Jose, CA (US);
Junghyun Kwon, Santa Clara, CA (US);
Sayed Mehdi Sajjadi Mohammadabadi, San Jose, CA (US);
Bor-Jeng Chen, San Jose, CA (US);
Xin Liu, Pleasanton, CA (US);
Bala Siva Sashank Jujjavarapu, Sunnyvale, CA (US);
Mehran Maghoumi, Santa Clara, CA (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
In various examples, feature values corresponding to a plurality of views are transformed into feature values of a shared orientation or perspective to generate a feature map—such as a Bird's-Eye-View (BEV), top-down, orthogonally projected, and/or other shared perspective feature map type. Feature values corresponding to a region of a view may be transformed into feature values using a neural network. The feature values may be assigned to bins of a grid and values assigned to at least one same bin may be combined to generate one or more feature values for the feature map. To assign the transformed features to the bins, one or more portions of a view may be projected into one or more bins using polynomial curves. Radial and/or angular bins may be used to represent the environment for the feature map.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile