The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Feb. 02, 2024
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Kimito Katsuyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/30 (2017.01); G06T 5/20 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/30 (2017.01); G06T 5/20 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An image analysis device includes a processor. An infrared thermal image acquisition unitof the processor acquires a first infrared thermal image and a second infrared thermal image obtained by imaging the object from different imaging positions, respectively. A registration unitof the processor performs registration of the first infrared thermal image and the second infrared thermal image. A first processing unitof the processor executes first processing including at least one of discrimination processing, suppression processing, or enhancement processing of background reflection of infrared light from the periphery of the object on an infrared thermal image obtained by imaging the object based on a difference between a temperature distribution of the first infrared thermal image and a temperature distribution of the second infrared thermal image after the registration.


Find Patent Forward Citations

Katsuyama, Kimito. (2026). Image analysis device, method, and program (U.S. Patent No. 12646186). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12646186

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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