The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Mar. 08, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Hirotomo Tanaka, Chiba, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection system includes a printing apparatus and an inspection apparatus that executes an inspection by comparing an image of a printed material printed by the printing apparatus and a reference image, the inspection apparatus including one or more memory devices that store a set of instructions and one or more processors that execute the set of instructions to extract, from an image of the printed material, a region corresponding to a content type on a basis of content information of the reference image, the content type indicating attribution of an image of the printed material, to set an inspection level based on a corresponding type for each extracted region, to present, to a user, the extracted region and the set inspection level, associated with the reference image, and to inspect the extracted region using the reference image and the set inspection level.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile