The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Oct. 27, 2023
Applicant:

Korea Photonics Technology Institute, Gwangju, KR;

Inventors:

Hoe Min Kim, Gwangju, KR;

Sung Kuk Chun, Gwangju, KR;

Seon Man Kim, Gwangju, KR;

Kwang Hoon Lee, Gwangju, KR;

Jeong Rok Yun, Gwangju, KR;

Un Yong Kim, Gwangju, KR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 20/64 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06V 20/64 (2022.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01);
Abstract

Disclosed are an apparatus and system for evaluating a welding condition on the basis of three-dimensional data. An aspect of the present embodiment provides an apparatus for evaluating a welding condition, the apparatus including a communication unit configured to receive a three-dimensional image for an evaluation target from the outside, a base material recognition unit configured to recognize a base material from the three-dimensional image for the evaluation target by using a point cloud, a bead extraction unit configured to extract a welding bead welded between the base materials, a bead cross-section acquisition unit configured to acquire cross-sections at preset intervals for the extracted welding bead, and a profile analysis unit configured to analyze a profile of the welding bead for the cross-section acquired by the bead cross-section acquisition unit.


Find Patent Forward Citations

Kim, Hoe. (2026). Welding condition diagnosis apparatus and system based on 3d scanning data (U.S. Patent No. 12646161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12646161

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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