The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Mar. 23, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kunal Sawarkar, Franklin Park, NJ (US);

Shivam Raj Solanki, Austin, TX (US);

Christopher Chen, San Jose, CA (US);

Amit P. Joglekar, Olathe, KS (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G06N 20/10 (2019.01);
Abstract

Feature engineering, for example, in automated machine learning, can include receiving streaming data representing at least one attribute detected by a sensor over time. Long term point statistics associated with the streaming data can be computed. The streaming data can be quantized into intervals of time windows and short term point statistics based on the intervals can be computed. The long term point statistics and the short term point statistics can be normalized. Dynamic time warping can be applied across the normalized long term point statistics and short term point statistics. A pair of probability distributions can be generated associated with the dynamic time warped normalized long term point statistics and short term point statistics. Based on distance between the mean values of the probability distributions, machine learning input features can be produced. The machine learning input features can be fed to train a machine learning model for detecting anomaly.


Find Patent Forward Citations

Sawarkar, Kunal. (2026). Automated feature engineering (U.S. Patent No. 12646004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12646004

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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