The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Sep. 27, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jing Xu, Xi'an, CN;

Si Er Han, Xi'an, CN;

Xue Ying Zhang, Xi'an, CN;

Xiao Ming MA, Xi'an, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

In an approach for optimizing abnormal point detection, a processor receives a set of data, wherein the set of data is partially labeled time series data; determines a data block size for the set of data; splits the set of data into data blocks based on the data block size; computes trait measurements for traits for each data block; assigns a tag to each data block, wherein the tag is selected from the group consisting of a normal tag, an abnormality tag, and an unknown tag; uses the respective data blocks with either the normal tag or the abnormality tag as training data; updates the training data with artificial abnormalities; trains a detection model with the updated training data; and utilizes the trained detection model to predict whether the respective data blocks with the unknown tag have an abnormality or no abnormality.


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