The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2026

Filed:

Apr. 20, 2021
Applicant:

Etsy, Inc., Brooklyn, NY (US);

Inventors:

Aakash Sabharwal, San Francisco, CA (US);

Akhila Ananthram, San Francisco, CA (US);

Miao Wang, San Francisco, CA (US);

Ruixi Fan, Jersey City, NJ (US);

Sarah Hale, Santa Clara, CA (US);

Chu-Cheng Hsieh, San Jose, CA (US);

Tianle Hu, South San Francisco, CA (US);

Assignee:

Etsy, Inc., Brooklyn, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/22 (2019.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/221 (2019.01); G06F 18/2148 (2023.01);
Abstract

A unified system with a machine learning feature data pipeline that can be shared among various product areas or teams of an electronic platform is described. A set of features can be fetched from multiple feature sources. The set of features can be combined with browsing event data to generate combined data. The combined data can be sampled to generate sampled data. The sampled data can be presented in a format having a structure that is agnostic to a feature source from which the set of features was fetched. The sampled data can be joined with old features by a backfilling process to generate training data designed to train one or more machine learning models. Related methods, apparatuses, articles of manufacture, and computer program products are also described.


Find Patent Forward Citations

Loading…